TRAPPING AND RECOMBINATION CENTERS IN PLASTICALLY BENT SILICON

被引:1
作者
MATSUURA, K
INUISHI, Y
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D O I
10.1143/JPSJ.17.874
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:874 / &
相关论文
共 3 条
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HANNEY NB, 1959, SEMICONDUCTORS, P503
[2]  
HORNBECK JA, 1953, PHYS REV, V97, P311
[3]   MICROWAVE TECHNIQUES IN MEASUREMENT OF LIFETIME IN GERMANIUM [J].
RAMSA, AP ;
JACOBS, H ;
BRAND, FA .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (07) :1054-1060