TEST-RESULTS ON DOUBLE SIDED READOUT SILICON STRIP DETECTORS

[1] BATIGNANI G, 1988, 3RD TOP SEM PERSP EX

[2] BATIGNANI G, 1987, SEP LOND C POS SENS

[3] FOCARDI E, 1986 IEEE NUCL SCI S

[4] SILICON RADIATION DETECTOR ANALYSIS USING BACK ELECTRON-BEAM INDUCED CURRENT [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 253 (03) : 319 - 324

[5] CHARGE COLLECTION SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : R51 - R80

[1] BATIGNANI G, 1988, 3RD TOP SEM PERSP EX

[2] BATIGNANI G, 1987, SEP LOND C POS SENS

[3] FOCARDI E, 1986 IEEE NUCL SCI S

[4] SILICON RADIATION DETECTOR ANALYSIS USING BACK ELECTRON-BEAM INDUCED CURRENT [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 253 (03) : 319 - 324

[5] CHARGE COLLECTION SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : R51 - R80