SILICON RADIATION DETECTOR ANALYSIS USING BACK ELECTRON-BEAM INDUCED CURRENT

被引：4

作者：

GUYE, R ^{[1
]}

JARRON, P ^{[1
]}

机构：

[1] CERN,CH-1211 GENEVA 23,SWITZERLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 253卷 / 03期

关键词：

D O I：

10.1016/0168-9002(87)90513-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：319 / 324

页数：6

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