BELOW EDGE X-RAY-EMISSION STRUCTURE

被引:6
作者
HANSON, AL [1 ]
BAJT, S [1 ]
JOHNSON, BM [1 ]
MERON, M [1 ]
RIVERS, ML [1 ]
机构
[1] UNIV CHICAGO,CHICAGO,IL 60637
基金
美国国家科学基金会;
关键词
D O I
10.1016/0375-9601(93)90362-4
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
High-resolution spectroscopy was used to study X-ray resonant Raman scattering, or the below edge X-ray emission structure, of three different chromium compounds. The measured energy shifts of the spectral features are not consistent with theoretical predictions. This work demonstrates that a technique based on BEXES can be developed for oxidation state determinations.
引用
收藏
页码:143 / 147
页数:5
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