BELOW EDGE X-RAY-EMISSION STRUCTURE

被引：6

作者：

HANSON, AL ^{[1
]}

BAJT, S ^{[1
]}

JOHNSON, BM ^{[1
]}

MERON, M ^{[1
]}

RIVERS, ML ^{[1
]}

机构：

[1] UNIV CHICAGO,CHICAGO,IL 60637

来源：

PHYSICS LETTERS A | 1993年 / 184卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0375-9601(93)90362-4

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

High-resolution spectroscopy was used to study X-ray resonant Raman scattering, or the below edge X-ray emission structure, of three different chromium compounds. The measured energy shifts of the spectral features are not consistent with theoretical predictions. This work demonstrates that a technique based on BEXES can be developed for oxidation state determinations.

引用

收藏

页码：143 / 147

页数：5

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