ULTRAHIGH VACUUM REFLECTOMETER FOR USE WITH EXTREME ULTRAVIOLET SYNCHROTRON RADIATION

被引：13

作者：

FEUERBACHER, B

SKIBOWSKI, M

GODWIN, RP

机构：

[1] Sektion Physik, Universität München

[2] Deutsches Elektronen-Synchrotron, Hamburg

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1969年 / 40卷 / 02期

关键词：

D O I：

10.1063/1.1683923

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An ultrahigh vacuum reflectometer is described. It can be used to study reflectance, transmittance, and photoemission on samples evaporated in situ. The angle of incidence can be varied from 0 to ±90° in steps of 7.5°. The system rotates about the axis of the incident light for study of polarization effects. With the polarized continuum of synchrotron radiation and a normal-incidence monochromator the reflectometer allows measurements with polarized light at wavelengths down to about 300 Å. © 1969 The American Institute of Physics.

引用

页码：305 / +

页数：1

共 10 条

[1] PLASMA RESONANCE IN REFLECTION SPECTRUM OF THIN ALUMINIUM FILMS
FEUERBACHER, B
GODWIN, RP
SKIBOWSKI, M
[J]. PHYSICS LETTERS A, 1968, A 26 (12) : 595 - +
[2] EFFECT OF OXIDATION ON PHOTOCURRENT FROM AN AL FILM IRRADIATED WITH POLARIZED LIGHT NEAR PLASMA WAVELENGTH
FEUERBACHER, B
SKIBOWSKI, M
STEINMANN, W
GODWIN, RP
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1968, 58 (01) : 137 - +
[3] OPTICAL CONSTANTS OF GERMANIUM IN REGION OF M45 EDGE
FEUERBACHER, B
SKIBOWSKI, M
GODWIN, RP
SASAKI, T
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1968, 58 (11) : 1434 - +
[4] FEUERBACHER B, 1968, THESIS U MUNCHEN
[5] HASS G, 1963, PHYSICS THIN FILM ED, V1, P134
[6] MADDEN RP, 1963, PHYS THIN FILMS, V1, P134
[7] NORMAL-INCIDENCE MONOCHROMATOR FOR VACUUM ULTRAVIOLET RADIATION FROM AN ELECTRON SYNCHROTRON
SKIBOWSKI, M
STEINMANN, W
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (01) : 112 - +
[8] INVESTIGATIONS OF ALUMINUM FILMS WITH SYNCHROTRON RADIATION OF WAVELENGTHS 500 TO 1000 A .2. POLARIZATION DEPENDENT PHOTOEFFECT
SKIBOWSKI, M
FEUERBACHER, B
STEINMANN, W
GODWIN, RP
[J]. ZEITSCHRIFT FUR PHYSIK, 1968, 211 (04): : 342 - +
[9] INVESTIGATIONS OF ALUMINUM FILMS WITH SYNCHROTRON RADIATION OF WAVELENGTHS 500 TO 1000 A .I. POLARIZATION DEPENDENT TRANSMISSION AND REFLECTION
SKIBOWSKI, M
FEUERBACHER, B
STEINMANN, W
[J]. ZEITSCHRIFT FUR PHYSIK, 1968, 211 (04): : 329 - +
[10] ANGLE-DOUBLER FOR REFLECTANCE MEASUREMENTS IN EVACUATED SYSTEMS
VEHSE, RC
SUTHERLAND, JC
ARAKAWA, ET
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (02) : 268 - +

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