OPTICAL CONSTANTS OF GERMANIUM IN REGION OF M45 EDGE

[1] ABELES F, 1966, OPTICAL PROPERTIE ED, P136

[2] ELECTRONIC BAND STRUCTURE OF GROUP IV ELEMENTS AND OF III-V COMPOUNDS [J]. PHYSICAL REVIEW, 1963, 130 (01): : 20 - &

[3] WIRKUNGSQUERSCHNITTE FUR ELASTISCHE UND UNELASTISCHE ELEKTRONENSTREUUNG AN AMORPHEN KOHLENSTOFF- UND GERMANIUMSCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1965, 184 (03): : 271 - &

[4] ELECTRONIC SPECTRA OF CRYSTALLINE GERMANIUM + SILICON [J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 134 (5A): : 1337 - &

[5] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K [J]. PHYSICAL REVIEW, 1955, 99 (04): : 1151 - 1155

[6] FEUERBACHER B, 1869, REV SCI INSTR, V40

[7] UNTERSUCHUNG DER CHARAKTERISTISCHEN ENERGIEVERLUSTE MIT HILFE DER GEGENFELDMETHODE [J]. ZEITSCHRIFT FUR PHYSIK, 1956, 145 (01): : 20 - 43

[8] HAENSEL R, 1967, Z ANGEW PHYSIK, V23, P276

[9] Hunter W. R., 1966, OPTICAL PROPERTIES E, P136

[10] ERRORS IN USING REFLECTANCE VS ANGLE OF INCIDENCE METHOD FOR MEASURING OPTICAL CONSTANTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1197 - &

[1] ABELES F, 1966, OPTICAL PROPERTIE ED, P136

[2] ELECTRONIC BAND STRUCTURE OF GROUP IV ELEMENTS AND OF III-V COMPOUNDS [J]. PHYSICAL REVIEW, 1963, 130 (01): : 20 - &

[3] WIRKUNGSQUERSCHNITTE FUR ELASTISCHE UND UNELASTISCHE ELEKTRONENSTREUUNG AN AMORPHEN KOHLENSTOFF- UND GERMANIUMSCHICHTEN [J]. ZEITSCHRIFT FUR PHYSIK, 1965, 184 (03): : 271 - &

[4] ELECTRONIC SPECTRA OF CRYSTALLINE GERMANIUM + SILICON [J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 134 (5A): : 1337 - &

[5] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K [J]. PHYSICAL REVIEW, 1955, 99 (04): : 1151 - 1155

[6] FEUERBACHER B, 1869, REV SCI INSTR, V40

[7] UNTERSUCHUNG DER CHARAKTERISTISCHEN ENERGIEVERLUSTE MIT HILFE DER GEGENFELDMETHODE [J]. ZEITSCHRIFT FUR PHYSIK, 1956, 145 (01): : 20 - 43

[8] HAENSEL R, 1967, Z ANGEW PHYSIK, V23, P276

[9] Hunter W. R., 1966, OPTICAL PROPERTIES E, P136

[10] ERRORS IN USING REFLECTANCE VS ANGLE OF INCIDENCE METHOD FOR MEASURING OPTICAL CONSTANTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1197 - &