LASER-ENHANCED IONIZATION SPECTROMETRY IN FLAMES - A POWERFUL AND VERSATILE TECHNIQUE FOR ULTRA-SENSITIVE TRACE-ELEMENT ANALYSIS

被引：52

作者：

AXNER, O ^{[1
]}

RUBINSZTEINDUNLOP, H ^{[1
]}

机构：

[1] GOTHENBURG UNIV,S-41296 GOTHENBURG,SWEDEN

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 09期

关键词：

D O I：

10.1016/0584-8547(89)80085-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：835 / &

共 78 条

[1] Alkemade C. T. J., 1982, METAL VAPOURS FLAMES
[2] IMPROVED THEORY OF LASER-ENHANCED IONIZATION IN FLAMES - COMPARISON WITH EXPERIMENT
AXNER, O
BERGLIND, T
HEULLY, JL
LINDGREN, I
RUBINSZTEINDUNLOP, H
[J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (09) : 3215 - 3225
[3] THEORY OF LASER-ENHANCED IONIZATION IN FLAMES - COMPARISON WITH EXPERIMENTS
AXNER, O
BERGLIND, T
HEULLY, JL
LINDGREN, I
RUBINSZTEINDUNLOP, H
[J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-7): : 311 - 317
[4] LASER-ENHANCED IONIZATION SPECTROSCOPY AROUND THE IONIZATION LIMIT
AXNER, O
BERGLIND, T
SJOSTROM, S
[J]. PHYSICA SCRIPTA, 1986, 34 (01): : 18 - 23
[5] DETERMINATION OF TRACE-ELEMENTS IN WATER SOLUTION BY LASER ENHANCED IONIZATION USING COUMARIN-47
AXNER, O
MAGNUSSON, I
[J]. PHYSICA SCRIPTA, 1985, 31 (06): : 587 - 591
[6] STARK STRUCTURE OBSERVATION IN RYDBERG STATES OF LI IN FLAMES BY LASER-ENHANCED IONIZATION - A NEW METHOD FOR PROBING LOCAL ELECTRICAL FIELDS IN FLAMES
AXNER, O
BERGLIND, T
[J]. APPLIED SPECTROSCOPY, 1986, 40 (08) : 1224 - 1231
[7] DETECTION OF TRACES IN SEMICONDUCTOR-MATERIALS BY 2-COLOR LASER-ENHANCED IONIZATION SPECTROSCOPY IN FLAMES
AXNER, O
LEJON, M
MAGNUSSON, I
RUBINSZTEINDUNLOP, H
SJOSTROM, S
[J]. APPLIED OPTICS, 1987, 26 (17): : 3521 - 3525
[8] TRACE-ELEMENT DETERMINATION IN FLAMES BY LASER ENHANCED IONIZATION SPECTROMETRY
AXNER, O
LINDGREN, I
MAGNUSSON, I
RUBINSZTEINDUNLOP, H
[J]. ANALYTICAL CHEMISTRY, 1985, 57 (03) : 773 - 776
[9] INVESTIGATION OF THE MULTIELEMENT CAPABILITY OF LASER-ENHANCED IONIZATION SPECTROMETRY IN FLAMES FOR ANALYSIS OF TRACE-ELEMENTS IN WATER SOLUTIONS
AXNER, O
MAGNUSSON, I
PETERSSON, J
SJOSTROM, S
[J]. APPLIED SPECTROSCOPY, 1987, 41 (01) : 19 - 26
[10] AXNER O, 1987, TECHNICAL DIGEST, V5, P54

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