DETECTION OF TRACES IN SEMICONDUCTOR-MATERIALS BY 2-COLOR LASER-ENHANCED IONIZATION SPECTROSCOPY IN FLAMES

被引：17

作者：

AXNER, O

LEJON, M

MAGNUSSON, I

RUBINSZTEINDUNLOP, H

SJOSTROM, S

机构：

来源：

APPLIED OPTICS | 1987年 / 26卷 / 17期

关键词：

D O I：

10.1364/AO.26.003521

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3521 / 3525

页数：5

共 17 条

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[2] LASER-ENHANCED IONIZATION SPECTROSCOPY AROUND THE IONIZATION LIMIT [J].

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[3] INVESTIGATION OF THE MULTIELEMENT CAPABILITY OF LASER-ENHANCED IONIZATION SPECTROMETRY IN FLAMES FOR ANALYSIS OF TRACE-ELEMENTS IN WATER SOLUTIONS [J].

AXNER, O ;

MAGNUSSON, I ;

PETERSSON, J ;

SJOSTROM, S .

APPLIED SPECTROSCOPY, 1987, 41 (01) :19-26

[4]

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[8] ELIMINATION OF SPECTRAL INTERFERENCE USING 2-STEP EXCITATION LASER ENHANCED IONIZATION [J].

MAGNUSSON, I ;

AXNER, O ;

RUBINSZTEINDUNLOP, H .

PHYSICA SCRIPTA, 1986, 33 (05) :429-433

[9] LASER-ENHANCED IONIZATION DETECTION OF TRACE-ELEMENTS IN A GRAPHITE-FURNACE [J].

MAGNUSSON, I ;

AXNER, O ;

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APPLIED SPECTROSCOPY, 1986, 40 (07) :968-971

[10]

MAGNUSSON I, IN PRESS SPECTROCHIM

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