DETECTION OF TRACES IN SEMICONDUCTOR-MATERIALS BY 2-COLOR LASER-ENHANCED IONIZATION SPECTROSCOPY IN FLAMES

被引：17

作者：

AXNER, O

LEJON, M

MAGNUSSON, I

RUBINSZTEINDUNLOP, H

SJOSTROM, S

机构：

来源：

APPLIED OPTICS | 1987年 / 26卷 / 17期

关键词：

D O I：

10.1364/AO.26.003521

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3521 / 3525

页数：5

共 17 条

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ANALYTICAL CHEMISTRY, 1979, 51 (09) :1516-1520

[12]

TRAVIS JC, 1984, PROG ANAL ATOM SPECT, V7, P199

[13]

TRAVIS JC, 1982, ANAL CHEM, V54, pA1006

[14] ANALYTICAL FLAME SPECTROMETRY WITH LASER ENHANCED IONIZATION [J].

TURK, GC ;

TRAVIS, JC ;

DEVOE, JR ;

OHAVER, TC .

ANALYTICAL CHEMISTRY, 1978, 50 (06) :817-820

[15] IMPROVED SENSITIVITY FOR LASER ENHANCED IONIZATION SPECTROMETRY IN FLAMES BY STEPWISE EXCITATION [J].

TURK, GC ;

MALLARD, WG ;

SCHENCK, PK ;

SMYTH, KC .

ANALYTICAL CHEMISTRY, 1979, 51 (14) :2408-2410

[16] LASER ENHANCED IONIZATION SPECTROMETRY IN ANALYTICAL FLAMES [J].

TURK, GC ;

TRAVIS, JC ;

DEVOE, JR ;

OHAVER, TC .

ANALYTICAL CHEMISTRY, 1979, 51 (12) :1890-1896

[17]

TURK GC, 1981, ANAL CHEM, V54, P1187

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