MOTT FACTORS OF P, V, FE, GA, AS, PD, IN, TA, AND W FOR 500-3000EV ELECTRONS

被引：11

作者：

JABLONSKI, A ^{[1
]}

GERGELY, G ^{[1
]}

机构：

[1] HUNGARIAN ACAD SCI,TECH PHYS RES INST,H-1361 BUDAPEST 5,HUNGARY

来源：

SCANNING | 1989年 / 11卷 / 01期

关键词：

D O I：

10.1002/sca.4950110107

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：29 / 42

页数：14

共 20 条

[1]

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[2]

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[3]

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GERGELY, G .

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[5] SOME NEW POSSIBILITIES IN NONDESTRUCTIVE DEPTH PROFILING USING SECONDARY-EMISSION SPECTROSCOPY - REELS AND EPES [J].

GERGELY, G ;

MENYHARD, M ;

SULYOK, A .

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[6]

GERGELY G, 1986, SCANNIGN, V8, P103

[7]

GREGORY D, 1974, ATOM DATA, V14, P29

[8] A STUDY BY ELASTICALLY REFLECTED ELECTRONS OF INP (100) SUBSTRATES PREVIOUSLY ION BOMBARDED [J].

GRUZZA, B ;

ACHARD, B ;

PARISET, C .

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[9]

GRUZZA B, 1985, SURF SCI, V161, P202

[10] MONTE-CARLO CALCULATION APPROACH TO QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY [J].

ICHIMURA, S ;

ARATAMA, M ;

SHIMIZU, R .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2853-2860

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