SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER

The kinematical and dynamical components of diffracted X‐rays from perfect and mechanically damaged silicon single crystals are separately measured in the vicinity of the reciprocal lattice point using a triple crystal arrangement of (+n, −n, +n) setting. In the case of a perfect erystal, besides the normal dynamical diffraction, a broad and weak hump due to the lattice vibration is observed at the scattering vector deviation as small as 2 × 103 cm−1. For crystals with lapped and scratched surface a noticeable change of the intensity curves, i.e. a change of the equal‐intensity contour in the reciprocal space, is observed. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA