X-RAY DIFFUSE-SCATTERING FROM SILICON CONTAINING OXYGEN CLUSTERS

[1] DIFFUSE SCATTERING FROM DEFECT CLUSTERS NEAR BRAGG REFLECTIONS [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (04): : 1041 - +

[2] ERHART P, 1973, PHYS REV B, V8, P2604

[3] OXYGEN CONTENT OF SILICON SINGLE CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (08) : 882 - 887

[4] Krivoglaz M., 1969, THEORY XRAY THERMAL

[5] COMPARISON OF DIFFUSE SCATTERING BY DEFECTS MEASURED IN ANOMALOUS TRANSMISSION AND NEAR BRAGG REFLECTIONS [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1973, A 28 (05): : 626 - 632

[6] LARSON BC, TO BE PUBLISHED

[7] MAHER DM, TO BE PUBLISHED

[8] PATEL JL, TO BE PUBLISHED

[9] IMPURITY CLUSTERING EFFECTS ON ANOMALOUS TRANSMISSION OF X RAY IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) : 2716 - &

[10] X-RAY ANOMALOUS TRANSMISSION AND TOPOGRAPHY OF OXYGEN PRECIPITATION IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) : 3903 - 3906

[1] DIFFUSE SCATTERING FROM DEFECT CLUSTERS NEAR BRAGG REFLECTIONS [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (04): : 1041 - +

[2] ERHART P, 1973, PHYS REV B, V8, P2604

[3] OXYGEN CONTENT OF SILICON SINGLE CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (08) : 882 - 887

[4] Krivoglaz M., 1969, THEORY XRAY THERMAL

[5] COMPARISON OF DIFFUSE SCATTERING BY DEFECTS MEASURED IN ANOMALOUS TRANSMISSION AND NEAR BRAGG REFLECTIONS [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1973, A 28 (05): : 626 - 632

[6] LARSON BC, TO BE PUBLISHED

[7] MAHER DM, TO BE PUBLISHED

[8] PATEL JL, TO BE PUBLISHED

[9] IMPURITY CLUSTERING EFFECTS ON ANOMALOUS TRANSMISSION OF X RAY IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) : 2716 - &

[10] X-RAY ANOMALOUS TRANSMISSION AND TOPOGRAPHY OF OXYGEN PRECIPITATION IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) : 3903 - 3906