THERMAL NOISE MEASUREMENTS ON SPACE-CHARGE-LIMITED HOLE CURRENT IN SILICON

被引：2

作者：

GOLDER, J ^{[1
]}

NICOLET, MA ^{[1
]}

机构：

[1] CALTECH, PASADENA, CA 91109 USA

来源：

SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 05期

关键词：

D O I：

10.1016/0038-1101(73)90157-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：581 / 585

页数：5

相关论文

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