THEORETICAL DESCRIPTION OF GRAIN-BOUNDARY ELECTRON-SCATTERING BY AN EFFECTIVE MEAN FREE PATH

被引:123
作者
TELLIER, CR
机构
关键词
D O I
10.1016/0040-6090(78)90293-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:311 / 317
页数:7
相关论文
共 14 条
[1]  
[Anonymous], [No title captured]
[2]  
CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P299
[3]  
Chopra K.L, 1969, THIN FILM PHENOMENA
[4]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[5]   TEMPERATURE COEFFICIENT OF RESISTANCE IN THIN METAL FILMS [J].
LEONARD, WF ;
RAMEY, RL .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) :3634-&
[6]   ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACES [J].
MAYADAS, AF ;
SHATZKES, M ;
JANAK, JF .
APPLIED PHYSICS LETTERS, 1969, 14 (11) :345-&
[7]   ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].
MAYADAS, AF ;
SHATZKES, M .
PHYSICAL REVIEW B, 1970, 1 (04) :1382-&
[9]   THE MEAN FREE PATH OF ELECTRONS IN METALS [J].
SONDHEIMER, EH .
ADVANCES IN PHYSICS, 1952, 1 (01) :1-42
[10]   MAYADAS-SHATZKES CONDUCTION IN NUCLEATION-GROWN RF SPUTTERED FILMS OF ALUMINUM [J].
TELLIER, C ;
TOSSER, A .
THIN SOLID FILMS, 1976, 37 (02) :207-214