QUANTITATIVE ANALYTICAL ELECTRON-MICROSCOPY

被引：22

作者：

CHAMPNESS, PE ^{[1
]}

CLIFF, G ^{[1
]}

LORIMER, GW ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT MET,MANCHESTER M1 7HS,ENGLAND

来源：

BULLETIN DE MINERALOGIE | 1981年 / 104卷 / 2-3期

关键词：

D O I：

10.3406/bulmi.1981.7464

中图分类号：

P57 [矿物学];

学科分类号：

070901 ;

摘要：

引用

页码：236 / 240

页数：5

共 14 条

[1]

Amelinckx S., 1964, DIRECT OBSERVATION D

[2] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].

CLIFF, G ;

LORIMER, GW .

JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207

[3] IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

FAULKNER, RG ;

HOPKINS, TC ;

NORRGARD, K .

X-RAY SPECTROMETRY, 1977, 6 (02) :73-79

[4]

Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315

[5] EFFICIENCY OF PRODUCTION OF CHARACTERISTIC X-RADIATION IN THICK TARGETS OF A PURE ELEMENT [J].

GREEN, M ;

COSSLETT, VE .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 78 (505) :1206-&

[6]

ILYIN NP, 1979, MIKROCHIMICA ACTA S8, P213

[7] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].

KELLY, PM ;

JOSTSONS, A ;

BLAKE, RG ;

NAPIER, JG .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02) :771-780

[8]

KYSER DF, 1977, 8TH P INT C XRAY OPT

[9]

LORIMER GW, 1977, ELECTRON MICROSCOPY

[10]

LORIMER GW, 1980, 8TH P INT C XRAY OPT

← 1 2 →