IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：25

作者：

FAULKNER, RG

HOPKINS, TC

NORRGARD, K

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT MAT TECHNOL,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

[2] AB ATOMENERGI,STUDSVIK,SWEDEN

来源：

关键词：

D O I：

10.1002/xrs.1300060205

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：73 / 79

页数：7

共 10 条

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[5] DUNCUMB P, 1963, P S XRAY OPTICS XRAY, P431
[6] DUNCUMB P, 1971, TI303 RES REP
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GEISS, RH
HUANG, TC
[J]. X-RAY SPECTROMETRY, 1975, 4 (04) : 196 - 201
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