MODULATED PHOTODETECTION WITH SEMICONDUCTOR TIPS IN A SCANNING TUNNELING MICROSCOPE

被引：6

作者：

GROENEVELD, RHM

PRINS, MWJ

VANKEMPEN, H

机构：

[1] Research Institute for Materials, University of Nijmegen, 6525 ED Nijmegen

来源：

SURFACE SCIENCE | 1995年 / 331卷

关键词：

GALLIUM ARSENIDE; MAGNETIC PHENOMENA; METAL-INSULATOR-SEMICONDUCTOR THIN FILM STRUCTURES; METAL-METAL MAGNETIC THIN FILM STRUCTURES; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER; SURFACE PHOTOVOLTAGE; TUNNELING;

D O I：

10.1016/0039-6028(95)00164-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report on the detection of modulated light power irradiated into the tunnel junction of a scanning tunneling microscope. When semiconductor tips are used we can distinguish three contributions to the measured current: photocurrent due to electron-hole pair generation at the apex of the tip, a contribution of thermal tip-sample distance modulation, and a displacement current due to the surface photovoltage that develops on the tip surface. Using a simple model we can understand the phases of the detected signals with respect to the photoexcitation, and extract values for several capacitances and conductances involved in the tunnel junction. This is relevant for applications of high-frequency photoexcitation in scanned probe microscopies.

引用

页码：1299 / 1304

页数：6

共 9 条

[1] CALCULATED PHOTOCURRENTS AND SURFACE-BARRIER HEIGHTS [J].

ALDAO, CM ;

PALERMO, A ;

WEAVER, JH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (03) :493-496

[2] ANALYSIS AND COMPENSATION OF THERMAL EFFECTS IN LASER-ASSISTED SCANNING TUNNELING MICROSCOPY [J].

GRAFSTROM, S ;

KOWALSKI, J ;

NEUMANN, R ;

PROBST, O ;

WORTGE, M .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :568-572

[3]

Kane E. O., 1969, Tunneling phenomena in solids, P1

[4] OPTICAL NEAR-FIELD IMAGING WITH A SEMICONDUCTOR PROBE TIP [J].

MERTZ, J ;

HIPP, M ;

MLYNEK, J ;

MARTI, O .

APPLIED PHYSICS LETTERS, 1994, 64 (18) :2338-2340

[5] PHOTOAMPERIC PROBES IN SCANNING-TUNNELING-MICROSCOPY [J].

PRINS, MWJ ;

VANDERWIELEN, MCMM ;

JANSEN, R ;

ABRAHAM, DL ;

VANKEMPEN, H .

APPLIED PHYSICS LETTERS, 1994, 64 (10) :1207-1209

[6] NEAR-FIELD MAGNETOOPTICAL IMAGING IN SCANNING-TUNNELING-MICROSCOPY [J].

PRINS, MWJ ;

GROENEVELD, RHM ;

ABRAHAM, DL ;

VANKEMPEN, H ;

VANKESTEREN, HW .

APPLIED PHYSICS LETTERS, 1995, 66 (09) :1141-1143

[7]

PRINS MWJ, IN PRESS IEEE T MAGN

[8]

PRINS MWJ, IN PRESS

[9]

SZE SM, 1981, PHYSICS SEMICONDUCTO

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