EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY

被引：113

作者：

ABRAHAM, FF ^{[1
]}

BATRA, IP ^{[1
]}

CIRACI, S ^{[1
]}

机构：

[1] BILKENT UNIV,DEPT PHYS,ANKARA,TURKEY

来源：

关键词：

D O I：

10.1103/PhysRevLett.60.1314

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1314 / 1317

页数：4

共 19 条

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[2] ABRAHAM FF, 1985, SURF SCI, V163, pL752, DOI 10.1016/0039-6028(85)91055-6
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[5] BATRA IP, 1987, IN PRESS J VAC SCI T
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[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[8] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY
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[J]. EUROPHYSICS LETTERS, 1986, 1 (01): : 31 - 36
[9] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE
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[10] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
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