MEASUREMENT OF THE TEMPERATURE OF COLD HIGHLY-CHARGED IONS PRODUCED IN AN ELECTRON-BEAM ION-TRAP

被引：29

作者：

BEIERSDORFER, P

DECAUX, V

WIDMANN, K

机构：

[1] Department of Physics and Space Technology, Lawrence Livermore National Laboratory, Livermore

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 98卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(95)00013-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The temperature of highly charged titanium ions produced and trapped in an electron beam ion trap was determined by precisely measuring the broadening of K-shell emission Lines in Ti19+ caused by the thermal Doppler motion. While interacting with a 3330 V electron beam the measured temperature of the titanium ions ranges from about 700 eV when the ions are confined in a deep trap to about 70 eV for ions in a shallow trap. The latter value represents the lowest temperature at which the K-shell X-ray emission from highly charged titanium ions has ever been recorded.

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页码：566 / 568

页数：3

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