ANALYSIS OF METASTABLE OPERATION IN RS CMOS FLIP-FLOPS

[1] ALBICKI A, 1983, 1983 P IEEE CUST INT, P239

[2] CHANEY TJ, 1979, JAN P CALTECH C VLSI, P357

[3] SYNCHRONIZATION RELIABILITY IN CMOS TECHNOLOGY [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 880 - 882

[4] GLASSER L, 1985, DESIGN ANAL VLSI CIR

[5] Gray P.R., 1984, ANAL DESIGN ANALOG I

[6] PREDICTION OF ERROR PROBABILITIES FOR INTEGRATED DIGITAL SYNCHRONIZERS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1984, 19 (02) : 236 - 244

[7] JACKSON TA, 1985, 6TH P BIENN U GOV IN, P177

[8] JACKSON TA, 1985, 12TH P INT C APPL SI

[9] JEAGER RC, 1985, 6TH P BIENN U GOV IN, P183

[10] KACPRZAK T, 1985, 28TH P MIDW S CIRC S, P190

[1] ALBICKI A, 1983, 1983 P IEEE CUST INT, P239

[2] CHANEY TJ, 1979, JAN P CALTECH C VLSI, P357

[3] SYNCHRONIZATION RELIABILITY IN CMOS TECHNOLOGY [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1985, 20 (04) : 880 - 882

[4] GLASSER L, 1985, DESIGN ANAL VLSI CIR

[5] Gray P.R., 1984, ANAL DESIGN ANALOG I

[6] PREDICTION OF ERROR PROBABILITIES FOR INTEGRATED DIGITAL SYNCHRONIZERS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1984, 19 (02) : 236 - 244

[7] JACKSON TA, 1985, 6TH P BIENN U GOV IN, P177

[8] JACKSON TA, 1985, 12TH P INT C APPL SI

[9] JEAGER RC, 1985, 6TH P BIENN U GOV IN, P183

[10] KACPRZAK T, 1985, 28TH P MIDW S CIRC S, P190