SYNCHRONIZATION RELIABILITY IN CMOS TECHNOLOGY

被引：25

作者：

FLANNAGAN, ST ^{[1
]}

机构：

[1] INTEL CORP,ALOHA,OR

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1985年 / 20卷 / 04期

关键词：

D O I：

10.1109/JSSC.1985.1052405

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：880 / 882

页数：3

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