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ANALYSIS OF IR PLASMA REFLECTIVITY SPECTRA - SURFACE CHARACTERIZATION

被引：6
作者：
GOPAL, V
机构：
来源：
INFRARED PHYSICS | 1981年 / 21卷 / 03期
关键词：
D O I：
10.1016/0020-0891(81)90024-5
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：159 / 165
页数：7
相关论文
共 8 条
[1]   OPTICAL-CONSTANTS OF VARIOUS HEAVILY DOPED PARA-TYPE SILICON-CRYSTALS AND NORMAL-TYPE SILICON-CRYSTALS OBTAINED BY KRAMERS-KRONIG ANALYSIS [J].
BARTA, E .
INFRARED PHYSICS, 1977, 17 (05) :319-329
[2]   DETERMINATION OF EFFECTIVE MASS VALUES BY A KRAMERS-KRONIG ANALYSIS FOR VARIOUSLY DOPED SILICON-CRYSTALS [J].
BARTA, E .
INFRARED PHYSICS, 1977, 17 (02) :111-119
[3]   OPTICAL PROPERTIES OF SOME PB1-XSNXTE ALLOYS DETERMINED FROM INFRARED PLASMA REFLECTIVITY MEASUREMENTS [J].
DIONNE, G ;
WOOLLEY, JC .
PHYSICAL REVIEW B, 1972, 6 (10) :3898-&
[4]  
DIXON JR, 1969, OPTICAL PROPERTIES S, pCH3
[5]   ANALYSIS OF INFRARED PLASMA REFLECTIVITY SPECTRA OF SEMICONDUCTORS [J].
GOPAL, V .
INFRARED PHYSICS, 1978, 18 (02) :121-125
[6]  
HEAVENS OS, OPTICAL PROPERTIES T
[7]  
Moss TS., 1959, OPTICAL PROPERTIES S
[8]  
MYCEILSKI A, 1972, PHYSICA STATUS SOL B, V52, P187
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