A QUANTITATIVE ASSESSMENT OF THE CAPABILITIES OF 21/2D MICROSCOPY FOR ANALYZING CRYSTALLINE SOLIDS

被引:13
作者
MICHAL, GM [1 ]
SINCLAIR, R [1 ]
机构
[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1980年 / 42卷 / 06期
关键词
D O I
10.1080/01418618008239378
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:691 / 704
页数:14
相关论文
共 14 条
[1]  
AGAR AW, 1974, PRACTICAL METHODS EL, V2, P101
[2]   2-1/2D ELECTRON-MICROSCOPY - THROUGH-FOCUS DARK-FIELD IMAGE SHIFTS [J].
BELL, WL .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) :1676-1682
[3]  
BELL WL, 1974, NEDO12476 GEN EL CO
[4]  
HIRSCH PB, 1977, ELECTRON MICROSCOPY, P10
[5]  
JULESZ B, 1971, F CYCLOPEAN PERCEPTI
[6]  
MICHAL GM, 1978, 9TH P INT C EL MICR, V1, P610
[7]  
MICHAL GM, 1979, THESIS STANFORD U
[8]   CHARACTERIZATION OF POINT-DEFECT CLUSTERS BY 2-1/2-D TEM [J].
MITCHELL, JB ;
BELL, WL .
ACTA METALLURGICA, 1976, 24 (02) :147-152
[9]  
MITCHELL JB, 1975, 33RD P ANN EMSA M BA, P160
[10]   SEPARATION AND IDENTIFICATION OF PHASES WITH THROUGH-FOCUS DARK-FIELD ELECTRON-MICROSCOPY [J].
RAO, P .
PHILOSOPHICAL MAGAZINE, 1975, 32 (04) :755-762