FIELD-ION MICROSCOPY OF INTERPHASE INTERFACES .2. EXPERIMENTAL

被引:9
作者
HILDON, A [1 ]
HOWELL, PR [1 ]
YOULE, A [1 ]
TAUNT, RJ [1 ]
PAGE, TF [1 ]
RALPH, B [1 ]
机构
[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE,ENGLAND
来源
JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 99卷 / SEP期
关键词
D O I
10.1111/j.1365-2818.1973.tb03851.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
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页码:41 / 56
页数:16
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