FIELD-ION MICROSCOPY OF INTERPHASE INTERFACES .2. EXPERIMENTAL

被引：9

作者：

HILDON, A ^{[1
]}

HOWELL, PR ^{[1
]}

YOULE, A ^{[1
]}

TAUNT, RJ ^{[1
]}

PAGE, TF ^{[1
]}

RALPH, B ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 99卷 / SEP期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03851.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：41 / 56

页数：16

共 20 条

[11]

PETKOV VV, 1971, DOPOV AKAD NAUK UR A, V9, P852

[12]

SINCLAIR R, IN PRESS

[13] ALTERNATIVE METHOD FOR ANALYZING ORIENTATION RELATIONSHIPS FROM FIELD-ION MICROSCOPE IMAGES [J].

SMITH, DA ;

GORINGE, MJ .

PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1505-&

[14] IMAGE FORMATION FROM ORDERED ALLOYS IN FIELD-ION MICROSCOPE [J].

SOUTHWORTH, HN ;

RALPH, B .

PHILOSOPHICAL MAGAZINE, 1970, 21 (169) :23-+

[15] ORDERING TRANSFORMATION IN NI2V [J].

TANNER, LE .

ACTA METALLURGICA, 1972, 20 (10) :1197-+

[16]

WALGATE D, IN PRESS

[17]

WALGATE DM, 1972, THESIS U CAMBRIDGE

[18]

Youle A., 1972, Metal Science Journal, V6, P149

[19]

YOULE A, 1972, THESIS U CAMBRIDGE

[20]

YOULE A, IN PRESS

← 1 2 →