STANDARD SAMPLES AND CALIBRATION OF PIXE ANALYSIS

被引：13

作者：

KASAHARA, M ^{[1
]}

TAKAHASHI, K ^{[1
]}

SAKISAKA, M ^{[1
]}

TOMITA, M ^{[1
]}

机构：

[1] KYOTO UNIV,DEPT NUCL ENGN,KYOTO 606,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 75卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(93)95629-J

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Standard samples were prepared by the vacuum evaporation method to calibrate the PIXE analysis. The sensitivities for each standard element were determined experimentally first using the standard samples, and then the sensitivities for other than standard elements were determined theoretically based on the experimental results. It is confirmed that the high purity carbon plate was useful as the backing for PIXE standard samples, and that the single element samples prepared in this study can be effectively applied to the PIXE calibration.

引用

页码：136 / 139

页数：4

共 9 条

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