THIN REFERENCE LAYERS AVAILABLE FOR CALIBRATION PURPOSES IN ION-BEAM ANALYSIS

被引：9

作者：

WATJEN, U

SCHROYEN, D

BOMBELKA, E

RIETVELD, P

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 50卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90352-U

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Evaporated standard layers of metals deposited on light substrates (mainly vitreous carbon) are available which can be employed to reduce some of the key uncertainties in ion beam analysis. Their preparation and the determination of their accurate areal density by a unique in-vacuum weighing procedure are described. Examples of our own application of such reference layers in Rutherford backscattering spectrometry (RBS) and particle-induced X-ray emission (PIXE) analysis are presented, all serving to improve the analytical accuracy. © 1990.

引用

页码：172 / 176

页数：5

共 9 条

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[3] AN INTERCOMPARISON OF SPECTRAL DATA-PROCESSING TECHNIQUES IN PIXE
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[4] USE OF AN ULTRAHIGH-VACUUM BALANCE FOR THE QUANTITATIVE ASSAY OF EVAPORATED REFERENCE LAYERS
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[5] HOW ACCURATE ARE ABSOLUTE RUTHERFORD BACKSCATTERING YIELDS
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DAVIES, JA
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[6] MORET H, 1970, VACUUM MICROBALANCE, V7, P173
[7] MORET H, 1965, VAC MICROBALANCE TEC, V5, P59
[8] RIETVELD PGJ, 1986, CBNM GERAS0386 INT R
[9] WATJEN U, 1988, CBNM GERAS0188 INT R

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