SIZE EFFECT AND TEMPERATURE-COEFFICIENT OF RESISTANCE IN THIN-FILMS

被引：52

作者：

WARKUSZ, F

机构：

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1978年 / 11卷 / 05期

关键词：

D O I：

10.1088/0022-3727/11/5/012

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：689 / 694

页数：6

共 16 条

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[5]

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[8] ELECTRICAL-RESISTIVITY, TCR AND THERMOELECTRIC-POWER OF ANNEALED THIN COPPER-FILMS [J].

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[9] SIZE EFFECT IN THERMOELECTRIC-POWER OF SILVER FILMS [J].

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MOHAN, S ;

REDDY, PJ .

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[10] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

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