THEORY OF MAGNETIC FORCE MICROSCOPY

被引：31

作者：

HARTMANN, U

机构：

[1] Institute for Thin Film and Ion Technology, KFA-Jülich

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.576409

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A theory is presented describing the fundamentals of contrast formation in magnetic force microscopy (MFM). In particular, effects due to the finite MFM probe size are taken into account. As a result, complete MFM images can be simulated in good agreement with experimental data employing only minimum information about the actual probe configuration. As an example, the 180° Bloch wall in iron is considered. © 1990, American Vacuum Society. All rights reserved.

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页码：411 / 415

页数：5

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