MEASUREMENT OF INPLANE MAGNETIZATION BY FORCE MICROSCOPY

[1] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[2] On inhomogeneities in the magnetization of ferromagnetic materials [J]. PHYSICAL REVIEW, 1931, 38 (10): : 1903 - 1905

[3] POLARIZED ELECTRON PROBES OF MAGNETIC-SURFACES [J]. SCIENCE, 1986, 234 (4774) : 333 - 340

[4] DISTEFANO TH, 1978, IBM TECH DISCL B, V20

[5] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 244 - 246

[6] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J]. APPLIED PHYSICS LETTERS, 1987, 50 (20) : 1455 - 1457

[7] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729

[8] REIMER L, 1984, SPRINGER SERIES OPTI, V36

[1] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[2] On inhomogeneities in the magnetization of ferromagnetic materials [J]. PHYSICAL REVIEW, 1931, 38 (10): : 1903 - 1905

[3] POLARIZED ELECTRON PROBES OF MAGNETIC-SURFACES [J]. SCIENCE, 1986, 234 (4774) : 333 - 340

[4] DISTEFANO TH, 1978, IBM TECH DISCL B, V20

[5] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 244 - 246

[6] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J]. APPLIED PHYSICS LETTERS, 1987, 50 (20) : 1455 - 1457

[7] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729

[8] REIMER L, 1984, SPRINGER SERIES OPTI, V36