SIMPLE METHOD OF AUTOMATIC LEED SPOT TRACING

被引：8

作者：

KANAJI, T

NAKATSUKA, H

URANO, T

TAKI, Y

机构：

[1] Faculty of Engineering, Kobe University, Kobe, 657, Rokkodai, Nada

来源：

SURFACE SCIENCE | 1979年 / 86卷 / JUL期

关键词：

D O I：

10.1016/0039-6028(79)90438-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A simple system for the measurement of LEED spot intensity has been developed. This system operates by the following mode; the spot photometer is driven, then the electron energy is changed automatically so that the spot tracks the photometer. By this system an I(hk)-V curve can be obtained in a few minutes. Examples of I-V curves obtained during a thin film formation are shown. © 1979.

引用

页码：587 / 590

页数：4

共 6 条

[1] USE OF A VIDICON CAMERA FOR MEASUREMENT OF LEED BEAM INTENSITIES BY PHOTOGRAPHIC METHOD
FROST, DC
MITCHELL, KAR
SHEPHERD, FR
WATSON, PR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (06): : 1196 - 1198
[2] FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER-CONTROLLED TELEVISION SYSTEM
HEILMANN, P
LANG, E
HEINZ, K
MULLER, K
[J]. APPLIED PHYSICS, 1976, 9 (03): : 247 - 251
[3] DETERMINATION OF ESCAPE LENGTH OF LOW-ENERGY ELECTRONS BY AUGER AND LOSS SPECTROSCOPY
KANAJI, T
KAGOTANI, T
NAGATA, S
[J]. THIN SOLID FILMS, 1976, 32 (02) : 362 - 362
[4] LEED STUDY OF MGO(100) .1. EXPERIMENT
LEGG, KO
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KINNIBURGH, C
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1974, 7 (23): : 4236 - 4246
[5] PULSED-BEAM LOW ENERGY ELECTRON DIFFRACTION SYSTEM FOR RAPID PRECISION MEASUREMENTS
PARK, RL
FARNSWORTH, HE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (11) : 1592 - &
[6] NEW RAPID AND ACCURATE METHOD TO MEASURE LOW-ENERGY-ELECTRON-DIFFRACTION BEAM INTENSITIES - INTENSITIES FROM CLEAN PT (111) CRYSTAL-FACE
STAIR, PC
KAMINSKA, TJ
KESMODEL, LL
SOMORJAI, GA
[J]. PHYSICAL REVIEW B, 1975, 11 (02): : 623 - 629

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