A SEMI-EMPIRICAL PROCEDURE FOR THE SIMPLE CALCULATION OF THE SIGNAL INTENSITY IN PIXE ANALYSIS OF THICK SAMPLES

被引：10

作者：

GARTEN, RPH ^{[1
]}

GROENEVELD, KO ^{[1
]}

KONIG, KH ^{[1
]}

机构：

[1] UNIV FRANKFURT,INST KERNPHYS,D-6000 FRANKFURT 70,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS | 1981年 / 181卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(81)90603-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：185 / 188

页数：4

共 13 条

[1] ENHANCEMENT IN PIXE ANALYSIS
AHLBERG, MS
[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 61 - 65
[2] [Anonymous], 1977, STOPPING RANGES IONS
[3] FOLKMANN F, 1976, ION BEAM SURFACE LAY, V2, P747
[4] INNER-SHELL VACANCY PRODUCTION IN ION-ATOM COLLISIONS
GARCIA, JD
FORTNER, RJ
KAVANAGH, TM
[J]. REVIEWS OF MODERN PHYSICS, 1973, 45 (02) : 111 - 177
[5] GARTEN R, 1980, THESIS JW GOETHE U F
[6] PROBLEMS OF DETECTION LIMIT AND SENSITIVITY OF LANTHANOIDS WITH PROTON-INDUCED X-RAY-EMISSION (PIXE) ANALYSIS OF THICK SAMPLES
GARTEN, RPH
GROENEVELD, KO
KONIG, KH
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1977, 288 (03): : 171 - 179
[7] GARTEN RPH, UNPUBLISHED
[8] ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION
JOHANSSON, SAE
JOHANSSON, TB
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03): : 473 - 516
[9] MATRIX EFFECTS IN PIXE ANALYSIS ON LIQUID SAMPLES WITH AN EXTERNAL BEAM
LIN, TL
LUO, CS
CHOU, JC
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 159 (2-3): : 387 - 393
[10] FITTED INNER-SHELL PROTON IONIZATION CROSS-SECTIONS FROM CA TO SN FOR 0.2-2-MEV INCIDENT ENERGY
LOPES, JS
JESUS, AP
RAMOS, SC
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 164 (02): : 369 - 374