ENHANCEMENT IN PIXE ANALYSIS

被引：50

作者：

AHLBERG, MS ^{[1
]}

机构：

[1] FLORIDA STATE UNIV,DEPT OCEANOG & PHYS,TALLAHASSEE,FL 32306

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(77)90809-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：61 / 65

页数：5

共 12 条

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[7] ELEMENTAL TRACE ANALYSIS OF SMALL SAMPLES BY PROTON-INDUCED X-RAY-EMISSION
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