LOW-ENERGY ELECTRON-DIFFRACTION FROM SI(111)-2 X 1 - THEORY AND EXPERIMENT

被引：63

作者：

FEDER, R ^{[1
]}

MONCH, W ^{[1
]}

AUER, PP ^{[1
]}

机构：

[1] GESMATHSCH DUISBURG,FESTKORPERPHYS LAB,D-4100 DUISBURG,FED REP GER

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1979年 / 12卷 / 05期

关键词：

D O I：

10.1088/0022-3719/12/5/001

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A dynamical theory of low-energy electron diffraction (LEED) is applied to the determination of the geometry of the 2*1-reconstructed (111) surface of silicon from experimental LEED intensity versus energy profiles. The top layer is 'buckled' by 0.30 AA, while the second layer shows a slight pairing between adjacent rows. The two topmost interlayer spacings are contracted by 10 and 3.5%, respectively, compared with the bulk values.

引用

页码：L179 / L184

页数：6

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