ATOMIC VERSUS BULK AL AUGER-ELECTRON EMISSION INDUCED BY NOBLE-GAS ION-BOMBARDMENT

被引:5
作者
BONANNO, A
MANDARINO, N
OLIVA, A
XU, F
机构
[1] UNIV CALABRIA,DIPARTIMENTO FIS,ARCAVACATA RENDE CS,I-87036 RENDE,ITALY
[2] INFM,COSENZA UNIT,I-87036 ARCAVACATA,ITALY
关键词
D O I
10.1016/0168-583X(92)95317-K
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present an angle resolved study on the Auger electron emission from an Al surface under noble gas ion bombardment along the normal incidence direction for primary energies varying from 5-15 keV. We show that the intensity ratio between the atomic LMM and the bulk LVV features decreases according to an inverse cosine law as the detection goes from normal to grazing directions and that such ratio changes considerably with the primary ions (Ar+, Kr+ and Xe+). These results provide important information on the deexcitation mechanism of the core excited Al particles.
引用
收藏
页码:161 / 164
页数:4
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