VARIATION OF YIELD WITH THICKNESS IN SIMS AND PDMS - MEASUREMENTS OF SECONDARY ION EMISSION FROM ORGANIZED MOLECULAR FILMS

被引：46

作者：

BOLBACH, G ^{[1
]}

BEAVIS, R ^{[1
]}

DELLANEGRA, S ^{[1
]}

DEPRUN, C ^{[1
]}

ENS, W ^{[1
]}

LEBEYEC, Y ^{[1
]}

MAIN, DE ^{[1
]}

SCHUELER, B ^{[1
]}

STANDING, KG ^{[1
]}

机构：

[1] INST CURIE,PHYS & CHIM BIOMOLEC LAB,PHYS & CHIM SECT,F-75231 PARIS 05,FRANCE

来源：

关键词：

D O I：

10.1016/0168-583X(88)90082-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：74 / 82

页数：9

共 53 条

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