SOME ASPECTS OF SECONDARY ION MASS-SPECTROMETRY OF ORGANIC-COMPOUNDS

被引：70

作者：

BENNINGHOVEN, A

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期

关键词：

D O I：

10.1016/0020-7381(83)85104-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：85 / 99

页数：15

共 30 条

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[5] SECONDARY ION MASS-SPECTROMETRY - NEW ANALYTICAL TECHNIQUE FOR BIOLOGICALLY IMPORTANT COMPOUNDS
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[J]. ORGANIC MASS SPECTROMETRY, 1977, 12 (09): : 595 - 597
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[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1967, A 22 (05): : 841 - +
[7] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .2. OXIDATION OF CHROMIUM IN MONOLAYER RANGE
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[J]. SURFACE SCIENCE, 1973, 39 (02) : 416 - 426
[8] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457
[9] BENNINGHOVEN A, 1982, SURF SCI, V123, pL721, DOI 10.1016/0039-6028(82)90122-4
[10] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION
BENNINGHOVEN, A
[J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

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