XPS ANALYSIS OF THERMAL AND PLASMA-TREATED POLYPARAPHENYLENE-VINYLENE THIN-FILMS AND THEIR INTERFACE FORMED WITH ALUMINUM LAYER

被引：20

作者：

NGUYEN, TP

AMGAAD, K

CAILLER, M

TRAN, VH

LEFRANT, S

机构：

[1] ISITEM,SCI SURFACES & INTERFACES MECAN LAB,F-44072 NANTES 03,FRANCE

[2] CNRS,MAT ORGAN PROPRIETES SPECIF LAB,F-69390 VERNAISON,FRANCE

来源：

SYNTHETIC METALS | 1995年 / 69卷 / 1-3期

关键词：

D O I：

10.1016/0379-6779(94)02541-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray photoelectron spectroscopy (XPS) was used to investigate the interface formed between thermally and plasma neared polyparaphenylene-vinylene thin films and an aluminium layer deposited on them. Enhancement in adhesion of the metal on thermally treated polymer films is explained by the structural change of aluminum layer. In contrast, plasma treatments induce morphological modifications of the polymer surface and favor the formation of compounds between the polymer and the metal which in turn improve the adhesive strength.

引用

页码：495 / 496

页数：2

共 6 条

[1] CHEMISTRY OF THE INTERFACE BETWEEN ALUMINUM AND POLYETHYLENETEREPHTHALATE BY XPS [J].