INTERFACE AND SURFACE-STRUCTURE OF EPITAXIAL NISI2 FILMS

[1] DIFFRACTION OF HE AT THE RECONSTRUCTED SI(100) SURFACE [J]. PHYSICAL REVIEW B, 1980, 21 (04): : 1497 - 1510

[2] HENZLER M, 1977, ELECTRON SPECTROSCOP

[3] ISHIWARA H, 1980, THIN FILM INTERFACES

[4] PHILLIPS JC, 1976, PHYS SEMICOND, P12

[5] ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : 737 - 743

[6] [No title captured]

[1] DIFFRACTION OF HE AT THE RECONSTRUCTED SI(100) SURFACE [J]. PHYSICAL REVIEW B, 1980, 21 (04): : 1497 - 1510

[2] HENZLER M, 1977, ELECTRON SPECTROSCOP

[3] ISHIWARA H, 1980, THIN FILM INTERFACES

[4] PHILLIPS JC, 1976, PHYS SEMICOND, P12

[5] ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : 737 - 743

[6] [No title captured]