CHARACTERIZATION OF TIHX AND TID0.9 SURFACES - AES, ELS, SIMS AND XPS STUDIES

被引：55

作者：

LAMARTINE, BC ^{[1
]}

HAAS, TW ^{[1
]}

SOLOMON, JS ^{[1
]}

机构：

[1] UNIV DAYTON,RES INST,DAYTON,OH 45469

来源：

APPLIED SURFACE SCIENCE | 1980年 / 4卷 / 3-4期

关键词：

D O I：

10.1016/0378-5963(80)90097-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：537 / 555

页数：19

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