INCOHERENT IMAGING OF THIN SPECIMENS USING COHERENTLY SCATTERED ELECTRONS

We consider the imaging of phase objects using a scanning transmission electron microscope equipped with a large inner-angle annular detector. We show, contrary to popular expectation, that incoherent imaging theory can be used to describe the imaging process in a plane perpendicular to the optical axis. Interference effects between atoms possessing the same projected coordinates must, however, be considered explicitly.