STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION

被引：165

作者：

TAKAHASHI, T

NAKATANI, S

OKAMOTO, N

ISHIKAWA, T

KIKUTA, S

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACT,TSUKUBA,IBARAKI 305,JAPAN

[2] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN

[3] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1988年 / 27卷 / 05期

关键词：

D O I：

10.1143/JJAP.27.L753

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L753 / L755

页数：3

共 18 条

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[2] VAN DER WAALS VOLUMES + RADII
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[4] THE EFFECT OF IMPURITY ON THE FORMATION OF THE SQUARE-ROOT-3X SQUARE-ROOT-3 (R30-DEGREES) SURFACE PHASE OF THE AG-SI(111) SYSTEM
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[5] NEW MODELS FOR METAL-INDUCED RECONSTRUCTIONS ON SI(111)
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[6] SURFACE-STRUCTURE STUDY OF SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-AG BY INCIDENT BEAM ROCKING AES METHOD
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[J]. SURFACE SCIENCE, 1985, 164 (2-3) : 589 - 601
[7] RHEED INTENSITY ANALYSIS OF SI(111)7X7 AND 3-SQUARE-ROOT X 3-SQUARE-ROOT-AG SURFACES .1. KINEMATIC DIFFRACTION APPROACH
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[J]. SURFACE SCIENCE, 1983, 133 (2-3) : 393 - 400
[8] X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE SI(111) SQUARE-ROOT3 X SQUARE-ROOT3-AG SURFACE
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SAGAWA, T
[J]. SURFACE SCIENCE, 1986, 165 (01) : 21 - 36
[9] ATOMIC ARRANGEMENT OF THE SI(111)-SQUARE-ROOT3XSQUARE-ROOT3-AG STRUCTURE DERIVED FROM LOW-ENERGY ION-SCATTERING SPECTROSCOPY
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OURA, K
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) : L421 - L424
[10] UNTERSUCHUNGEN ZUM SCHICHTWACHSTUM VON SILBER AUF DER SILIZIUM(111)-OBERFLACHE DURCH BEUGUNG LANGSAMER ELEKTRONEN
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