ANALYSIS OF X-RAY-DIFFRACTION LINE-PROFILES FROM SMALL EPITAXIAL BINARY DIFFUSION COUPLES - DETERMINATION OF CONCENTRATION PROFILE AND INFLUENCE OF TDS

被引：3

作者：

DELHEZ, R

MITTEMEIJER, EJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1978年 / 49卷 / 09期

关键词：

D O I：

10.1063/1.325558

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4770 / 4775

页数：6

共 32 条

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