X-RAY SECONDARY-EMISSION MICROSCOPY (XSEM) OF NEURONS

被引：16

作者：

DE STASIO, G

KORANDA, SF

TONNER, BP

HARP, GR

MERCANTI, D

CIOTTI, MT

MARGARITONDO, G

机构：

[1] UNIV WISCONSIN, DEPT PHYS, MILWAUKEE, WI 53211 USA

[2] UNIV WISCONSIN, CTR SYNCHROTRON RADIAT, STOUGHTON, WI 53589 USA

[3] CNR, IST NEUROBIOL, I-00100 ROME, ITALY

[4] ECOLE POLYTECH FED LAUSANNE, INST PHYS APPL, CH-1015 LAUSANNE, SWITZERLAND

来源：

EUROPHYSICS LETTERS | 1992年 / 19卷 / 07期

关键词：

BIOPHYSICAL INSTRUMENTATION AND TECHNIQUES; ELECTRON AND ION MICROSCOPES AND TECHNIQUES; PHOTOEMISSION AND PHOTOELECTRON SPECTRA;

D O I：

10.1209/0295-5075/19/7/015

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present the first X-ray secondary (photoelectron) emission microscopy (XSEM) pictures and video microimages of an uncoated and unstained neuron specimen. This novel kind of synchrotron radiation microscopy is suitable for local chemical analysis with a lateral resolution in the micron range. We explored the details of the neuron system, demonstrated chemical contrast by scanning the photon energy, studied in real time the photoelectron emitting properties of the specimen's components, and made preliminary tests of the radiation damage. These results significantly enhance the potential role of photoemission techniques in the life sciences and specifically in neurobiology.

引用

页码：655 / 659

页数：5

共 19 条

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