2 BEAM INTERFERENCE WITH FIELD-EMISSION ELECTRON-BEAM

被引：18

作者：

TONOMURA, A

MATSUDA, T

KOMODA, T

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1978年 / 17卷 / 06期

关键词：

D O I：

10.1143/JJAP.17.1137

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1137 / 1138

页数：2

共 10 条

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[3]

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[4]

MUNCH J, 1975, OPTIK, V43, P79

[5]

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[6]

SAXON G, 1972, OPTIK, V35, P195

[7] ELECTRON MICROHOLOGRAPHY BY 2-BEAM METHOD [J].

TOMITA, H ;

MATSUDA, T ;

KOMODA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (06) :719-&

[8] OPTICAL RECONSTRUCTION OF IMAGE FROM FRAUNHOFER ELECTRON-HOLOGRAM [J].

TONOMURA, A ;

FUKUHARA, A ;

WATANABE, H ;

KOMODA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (03) :295-+

[9]

TONOMURA A, 1973, J ELECTRON MICROSC, V22, P141

[10]

YADA K, 1973, J ELECTRON MICROSC, V22, P223

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