XPS STOICHIOMETRY MEASUREMENTS ON SURFACES OF III-V CRYSTALLINE COMPOUNDS

被引：31

作者：

ALNOT, P ^{[1
]}

OLIVIER, J ^{[1
]}

FADLEY, CS ^{[1
]}

机构：

[1] UNIV HAWAII MANOA,DEPT CHEM,HONOLULU,HI 96822

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1989年 / 49卷 / 02期

关键词：

D O I：

10.1016/0368-2048(89)85005-4

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：159 / 173

页数：15

共 34 条

[1] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY FOR THE CHARACTERIZATION OF GAAS(001) SURFACES [J].

ALNOT, P ;

OLIVIER, J ;

WYCZISK, F ;

FADLEY, CS .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1987, 43 (3-4) :263-286

[2]

ALNOT P, 1987, MATER RES SOC S P, V94, P231

[3] XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .1. AN ABSOLUTE, TRACEABLE ENERGY CALIBRATION AND THE PROVISION OF ATOMIC REFERENCE LINE ENERGIES [J].

ANTHONY, MT ;

SEAH, MP .

SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) :95-106

[4] XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .2. RESULTS OF AN INTERLABORATORY COMPARISON [J].

ANTHONY, MT ;

SEAH, MP .

SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) :107-115

[5] RECONSTRUCTIONS OF GAAS AND AIAS SURFACES AS A FUNCTION OF METAL TO AS RATIO [J].

BACHRACH, RZ ;

BAUER, RS ;

CHIARADIA, P ;

HANSSON, GV .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :335-343

[6] INCIDENT BEAM EFFECTS IN MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION [J].

CHAMBERS, SA ;

VITOMIROV, IM ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 36 (06) :3007-3015

[7] INCIDENT BEAM EFFECTS IN ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY [J].

CHAMBERS, SA ;

CHEN, HW ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (05) :3055-3059

[8]

CHANG CC, 1977, APPL PHYS LETT, V31, P305

[9] ANGLE-RESOLVED PHOTOEMISSION-STUDIES OF GAAS(100) SURFACES GROWN BY MOLECULAR-BEAM EPITAXY [J].

CHIANG, TC ;

LUDEKE, R ;

AONO, M ;

LANDGREN, G ;

HIMPSEL, FJ ;

EASTMAN, DE .

PHYSICAL REVIEW B, 1983, 27 (08) :4770-4778

[10] COMPOSITION AND STRUCTURE OF DIFFERENTLY PREPARED GAAS(100) SURFACES STUDIED BY LEED AND AES [J].

DRATHEN, P ;

RANKE, W ;

JACOBI, K .

SURFACE SCIENCE, 1978, 77 (01) :L162-L166

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