SIMILARITY OF THE LASER-ANNEALED AND THERMALLY ANNEALED SI(111) SURFACES

被引：50

作者：

ZEHNER, DM ^{[1
]}

WHITE, CW ^{[1
]}

HEIMANN, P ^{[1
]}

REIHL, B ^{[1
]}

HIMPSEL, FJ ^{[1
]}

EASTMAN, DE ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1981年 / 24卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.24.4875

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：4875 / 4878

页数：4

相关论文

共 20 条

[1] DYNAMICS OF Q-SWITCHED LASER ANNEALING
AUSTON, DH
GOLOVCHENKO, JA
SIMONS, AL
SURKO, CM
VENKATESAN, TNC
[J]. APPLIED PHYSICS LETTERS, 1979, 34 (11) : 777 - 779
[2] DEPENDENCE OF TRAPPING AND SEGREGATION OF INDIUM IN SILICON ON THE VELOCITY OF THE LIQUID-SOLID INTERFACE
BAERI, P
POATE, JM
CAMPISANO, SU
FOTI, G
RIMINI, E
CULLIS, AG
[J]. APPLIED PHYSICS LETTERS, 1980, 37 (10) : 912 - 914
[3] THE SI(111) 7X7 TO 1X1 TRANSITION
BENNETT, PA
WEBB, MW
[J]. SURFACE SCIENCE, 1981, 104 (01) : 74 - 104
[4] BUCKLING RECONSTRUCTION ON LASER-ANNEALED SI(111) SURFACES
CHABAL, YJ
ROWE, JE
ZWEMER, DA
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (09) : 600 - 603
[5] EASTMAN DE, 1980, J VAC SCI TECHNOL, V17, P492, DOI 10.1116/1.570492
[6] SIMILARITY BETWEEN THE SI(111)-(7 X 7) AND IMPURITY-STABILIZED SI(111)-(1 X 1) SURFACES
EASTMAN, DE
HIMPSEL, FJ
VANDERVEEN, JF
[J]. SOLID STATE COMMUNICATIONS, 1980, 35 (04) : 345 - 347
[7] AN ELLIPSOIDAL MIRROR DISPLAY ANALYZER SYSTEM FOR ELECTRON-ENERGY AND ANGULAR MEASUREMENTS
EASTMAN, DE
DONELON, JJ
HIEN, NC
HIMPSEL, FJ
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 172 (1-2): : 327 - 336
[8] EASTMAN DE, 1979, I PHYS C SER, V43, P1059
[9] THEORETICAL STUDIES OF ELECTRONIC-STRUCTURE OF SEMICONDUCTOR SURFACES
HAMANN, DR
[J]. SURFACE SCIENCE, 1977, 68 (01) : 167 - 177
[10] GEOMETRY-DEPENDENT SI(2P) SURFACE CORE-LEVEL EXCITATIONS FOR SI(111) AND SI(100) SURFACES
HIMPSEL, FJ
HEIMANN, P
CHIANG, TC
EASTMAN, DE
[J]. PHYSICAL REVIEW LETTERS, 1980, 45 (13) : 1112 - 1115