MEASURING THE JUNCTION TEMPERATURE OF ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS USING ELECTROLUMINESCENCE

被引：9

作者：

FUKAI, YK

MATSUOKA, Y

FURUTA, T

机构：

[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa 243-01

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 03期

关键词：

D O I：

10.1063/1.110036

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Rises in the junction temperatures of heterojunction bipolar transistors (HBTs) due to self-heating effects during transistor operation are measured using the electroluminescence of the band-to-band recombination. This method is useful for the direct junction temperature monitoring of small geometry devices. Junction temperatures measured in AlGaAs/GaAs HBTs with five 2 X 20 mum2 emitter fingers are raised 115-degrees-C when the product of the collector current and the emitter-collector voltage is 0.25 W. The thermal resistance is determined to be 260-degrees-C/W at 300 K.

引用

页码：340 / 342

页数：3

共 9 条

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