SURFACE CORRELATION-FUNCTION ANALYSIS OF HIGH-RESOLUTION SCATTERING DATA FROM MIRRORED SURFACES OBTAINED USING A TRIPLE-AXIS X-RAY DIFFRACTOMETER

[1] ALSNIELSEN J, 1986, STRUCTURES DYNAMICS, V2

[2] Beckmann P., 1963, SCATTERING ELECTROMA

[3] BILDERBACK DH, 1981, P SOC PHOTO-OPT INST, V315, P90

[4] A VERSATILE 3/4 CRYSTAL X-RAY DIFFRACTOMETER FOR X-RAY OPTICAL-ELEMENTS - PERFORMANCE AND APPLICATIONS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 256 (02) : 381 - 392

[5] Church E. L., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V680, P102, DOI 10.1117/12.939599

[6] Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196

[7] CHURCH EL, 1986, P SOC PHOTOOPT INSTR, V645

[8] CHURCH EL, 1986, P SOC PHOTOOPT INSTR, V640

[9] Compton A.H., 1935, XRAYS THEORY EXPT

[10] CROCE P, 1972, CR ACAD SCI B PHYS, V274, P855

[1] ALSNIELSEN J, 1986, STRUCTURES DYNAMICS, V2

[2] Beckmann P., 1963, SCATTERING ELECTROMA

[3] BILDERBACK DH, 1981, P SOC PHOTO-OPT INST, V315, P90

[4] A VERSATILE 3/4 CRYSTAL X-RAY DIFFRACTOMETER FOR X-RAY OPTICAL-ELEMENTS - PERFORMANCE AND APPLICATIONS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 256 (02) : 381 - 392

[5] Church E. L., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V680, P102, DOI 10.1117/12.939599

[6] Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196

[7] CHURCH EL, 1986, P SOC PHOTOOPT INSTR, V645

[8] CHURCH EL, 1986, P SOC PHOTOOPT INSTR, V640

[9] Compton A.H., 1935, XRAYS THEORY EXPT

[10] CROCE P, 1972, CR ACAD SCI B PHYS, V274, P855